智能电子设备顽健性测试方法
姜海涛,李斌,王祥,陈锦铭,郭雅娟
Robustness test method for intelligent electronic device
Haitao JIANG,Bin LI,Xiang WANG,Jinming CHEN,Yajuan GUO
电信科学 . 2015, (Z1): 125 -131 .  DOI: 10.11959/j.issn.1000-0801.2015390