智能电子设备顽健性测试方法

doi:10.11959/j.issn.1000-0801.2015390

摘要/Abstract

摘要：

摘要：为了检测变电站智能电子设备（intelligent electronic device,IED）通信模块的顽健性，提出了一种基于异常报文的设备顽健性测试方法，并实现了顽健性测试系统。选取部分设备进行顽健性测试实验，验证了测试方法的合理性与测试系统的可行性。实验结果表明，该测试方法能够有效地发现设备无法处理异常报文的问题，并定位导致设备异常的异常报文。

关键词: 顽健性测试, 智能电子设备, 智能变电站

Abstract:

To detect the robustness of communication module of intelligent electronic devices（IED）in smart station,a device robustness test method was presented based on abnormal messages,and a robustness testing system was achieved.Some devices were selected for robustness test experiment to verify the rationality and feasibility.Results show that the method can effectively detect the robustness of devices and locate the abnormal messages which cause devices' failure.

Key words: robustness test, intelligent electronic device, smart substation

姜海涛,李斌,王祥,陈锦铭,郭雅娟. 智能电子设备顽健性测试方法[J]. 电信科学, 2015, 31(Z1): 125-131.

Haitao JIANG,Bin LI,Xiang WANG,Jinming CHEN,Yajuan GUO. Robustness test method for intelligent electronic device[J]. Telecommunications Science, 2015, 31(Z1): 125-131.

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