5G毫米波终端测试方法及分析

doi:10.11959/j.issn.1000-0801.2023025

Abstract

Abstract:

In the 5G millimeter wave UE OTA RF conformance test, EIRP and TRP type of tests are important OTA items.Currently, this method relying on 3GPP-defined random scan to lock the beam to determine the maximum EIRP and TRP, but this method is time-consuming and lacks accuracy.A non-signaling test method was proposed, which could not only achieve more accurate measurements compared with the current EIRP and TRP test methods but also make it possible to use the non-directional OTA site as the measurement environment, further reducing the test cost and time cost, and increasing the flexibility of the test environment selection.

Key words: EIRP, TRP, beam peak search, Beam ID, reverberation chamber

CLC Number:

TN929.5

Jian GONG, Yu ZHANG. 5G millimeter wave UE test method and analysis[J]. Telecommunications Science, 2023, 39(2): 171-177.

Figures/Tables 9

俯仰角度θ	水平角度φ	测量的俯仰角度EIRP/(dBm·IBW^-1)	测量的水平角度EIRP/(dBm·IBW^-1)	测量的总EIRP/(dBm·IBW^-1)
15°	180°	20.643 783 57	19.265 953 06	23.019 581 47
15°	180°	20.637 414 93	19.237 966 54	23.004 117 38
15°	195°	19.488 574 98	17.191 644 67	21.500 524 54
15°	195°	14.953 868 87	8.7930 822 37	15.895 291 33
…	…	…	…	…
60°	135°	27.348 026 28	21.880 941 39	28.433 617 18
60°	135°	27.26 658 63	21.870 090 48	28.367 888 72
$60 °$	$120 °$	$27.007 026 67$	$24.798 971 18$	$29.052 141 44$
60°	120°	26.368 812 56	25.11 602 02	28.797 734 09
…	…	…	…	…

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频段/带宽	天线ID	Beam ID	测量的最大EIRP/dBm
n258/100 MHz	1	1	24.98
n258/100 MHz	1	2	29.29
n258/100 MHz	1	13	25.32
n258/100 MHz	2	3	25.35
n258/100 MHz	2	9	23.93
n258/100 MHz	2	14	28.21
n258/100 MHz	3	5	26.46
n258/100 MHz	3	8	33.50
n258/100 MHz	3	16	27.24

TRP检测项目	测试配置	紧缩场/远场测试时长	混响室测试时长
最大输出功率	测试信道：低、中、高	25×3×3=225	3×3×3=27
	测试带宽：最低、100MHz、最高	单配置耗时：25 min	单配置耗时：3 min
	调制方式和RB配置：1种
频谱辐射模板	测试信道：中	25×2×5=250	3×2×5=30
	测试带宽：最低、最高	单配置耗时：25 min	单配置耗时：3 min
	调制方式和RB配置：5种
杂散发射	测试信道：低、高	500×2×2=2 000	10×2×5=100
	测试带宽：最高	单配置耗时：500 min	单配置耗时：10 min
	调制方式和RB配置：2种
时长总计	上述配置	40 h	2.5 h

5G millimeter wave UE test method and analysis

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